The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2021

Filed:

Jun. 06, 2019
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventors:

Rumi Ghosh, Palo Alto, CA (US);

Soundararajan Srinivasan, Cambridge, MA (US);

Ruobing Chen, Mountain View, CA (US);

Shan Kang, Mountain View, CA (US);

Marc Naumann, Sunnyvale, CA (US);

Mahesh Goud Tandarpally, Los Angeles, CA (US);

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G05B 19/40 (2006.01); G06F 16/24 (2019.01); G05B 19/4063 (2006.01); G06F 16/2458 (2019.01);
U.S. Cl.
CPC ...
G05B 23/0297 (2013.01); G05B 19/4063 (2013.01); G06F 16/2465 (2019.01); G05B 2219/32177 (2013.01);
Abstract

Methods and systems of identifying a time reduction in a manufacturing time associated with a plurality of products. One system includes an electronic processor configured to receive a dataset associated with an assembly line. The dataset includes a classification for each of the plurality of products produced by the assembly line, where the assembly line is associated with a plurality of tests. The electronic processor is also configured to determine a set of test combinations for the assembly line based on the plurality of tests and, for each test combination, determine a number of missing products based on the classification for each of the plurality of products. The electronic processor is also configured to determine at least one test to remove based on the number of missing products for each test combination and output a result including an indication of the at least one test to remove.


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