The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10990089 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 27, 2021

Filed:

Jan. 25, 2019
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Hiroshi Takigawa, Yamanashi, JP;

Tetsuhisa Takazane, Yamanashi, JP;

Assignee:

Fanuc Corporation, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06N 20/00 (2019.01); H01S 5/0683 (2006.01); H01S 3/00 (2006.01);
U.S. Cl.
CPC ...
G05B 23/024 (2013.01); G05B 23/0243 (2013.01); G05B 23/0281 (2013.01); G05B 23/0283 (2013.01); G06N 20/00 (2019.01); H01S 3/00 (2013.01); H01S 5/0683 (2013.01); G05B 2219/33198 (2013.01); G05B 2219/36199 (2013.01);
Abstract

A machine learning device observes a state variable of the inside and the outside of a laser device including time-series data of light output, which is detected by an output light sensor, and a light output command through a control unit of the laser device, and acquires a determination result on correctness with respect to a quantitative failure occurrence mechanism outputted for each failure in the laser device. The machine learning device learns the quantitative failure occurrence mechanism corresponding to each failure while associating the quantitative failure occurrence mechanism with the state variable and the determination result on correctness with respect to the quantitative failure occurrence mechanism, and decides a quantitative failure occurrence mechanism which is to be outputted when an occurrence of each failure is detected.


Find Patent Forward Citations

Takigawa, Hiroshi. (2021). Machine learning device learning failure occurrence mechanism of laser device (U.S. Patent No. 10990089). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10990089

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