The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2021

Filed:

Nov. 27, 2019
Applicant:

Elenion Technologies, Llc, New York, NY (US);

Inventors:

Yang Liu, Elmhurst, NY (US);

Ruizhi Shi, New York, NY (US);

Tal Galfsky, Morristown, NJ (US);

Assignee:

Elenion Technologies, LLC, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/24 (2006.01);
U.S. Cl.
CPC ...
G02B 6/243 (2013.01); G02B 6/241 (2013.01);
Abstract

When routing light on photonic integrated circuit (PIC) chips optical back-reflection and scattering can be highly detrimental to the desired application. Unused ports of optical devices, such as MMI, DC, Y-junction, PD, etc. are a cause for back-reflection and scattering, whereby the scattered light could get picked up by adjacent components, e.g. photodetectors. Management of stray light on the PIC is needed to prevent the undesired coupling between various components and to reduce noise. A dump taper may be used to guide and scatter stray light away from sensitive components or fully absorb the light while maintaining very low reflection from the taper. A doped dump taper may be used to passively absorb light reaching the unused port, thereby eliminating unwanted reflection and scattering. Alternatively, an undoped taper may be used to scatter light away from sensitive components while maintaining very low back-reflection.


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