The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2021
Filed:
Apr. 15, 2020
Applicant:
The Curators of the University of Missouri, Columbia, MO (US);
Inventors:
Edward C. Kinzel, Columbia, MO (US);
Mahmoud Almasri, Columbia, MO (US);
Chuang Qu, Columbia, MO (US);
Ibrahem Jasim, Columbia, MO (US);
Jiayu Liu, Columbia, MO (US);
Assignee:
The Curators of the University of Missouri, Columbia, MO (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/036 (2006.01); G02B 6/02 (2006.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G02B 6/02395 (2013.01); G02B 6/02123 (2013.01); G02B 6/036 (2013.01); G03F 7/0005 (2013.01);
Abstract
A fiber-based sensor and a method of forming a fiber-based sensor using microsphere lithography techniques in which a microsphere array is applied to a surface of a tip of an optical fiber to provide for microsphere lithography fabrication of a desired pattern on the tip of the optical fiber. The characteristics of the pattern define sensing capabilities of the sensor to provide for chemical and/or biological sensing.