The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2021

Filed:

Sep. 27, 2018
Applicant:

Yonsei University, University - Industry Foundation (Uif), Seoul, KR;

Inventors:

Chang Min Hyun, Seogwipo-si, KR;

Jin Keun Seo, Seoul, KR;

Hwa Pyung Kim, Seoul, KR;

Sung Min Lee, Bucheon-si, KR;

Sung Chul Lee, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01); G01R 33/561 (2006.01); G06T 7/00 (2017.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4818 (2013.01); G01R 33/5608 (2013.01); G01R 33/5611 (2013.01); G06T 7/0014 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

An under-sampling apparatus for MR image reconstruction by using machine learning and a method thereof, an MR image reconstruction device by using machine learning and a method thereof, and a recoding medium thereof are disclosed. The disclosed under-smapling apparatus includes: a setting portion that sets a region corresponding to a center of the k-space image as a first region and remaining regions as a second region; and an under-sampling portion that full-samples the first region and under-samples the second region, wherein in the under-sampling performed in the second region, lines are selected at regular intervals and then only the selected line is full-sampled. According to the under-sampling apparatus, a high-resolution MR image can be acquired while reducing imaing time.


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