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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10989734 B1

PDFFull Text
Date of Patent:
Apr. 27, 2021

Filed:

Nov. 22, 2016

Information processing apparatus, information processing method, and storage medium

Applicant:

Sony Corporation, Tokyo, JP;

Inventor:

Sho Murakoshi, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:

Paratus Law Group, PLLC

Primary Examiner:

Herbert K Roberts

Assistant Examiner:

John M Royston

Int. Cl.
CPC ...
G01P 21/00 (2006.01); A61B 5/11 (2006.01); G01P 15/00 (2006.01); A63B 69/36 (2006.01); A61B 5/22 (2006.01); A61B 5/00 (2006.01); G01P 15/08 (2006.01); A63B 53/00 (2015.01); A63B 102/32 (2015.01); A63B 53/04 (2015.01);
U.S. Cl.
CPC ...
G01P 21/00 (2013.01); A61B 5/11 (2013.01); A61B 5/1117 (2013.01); A61B 5/22 (2013.01); A61B 5/7214 (2013.01); A61B 5/7246 (2013.01); A63B 53/00 (2013.01); A63B 69/36 (2013.01); A63B 69/3632 (2013.01); G01P 15/00 (2013.01); G01P 15/0802 (2013.01); A61B 5/1121 (2013.01); A61B 2562/0219 (2013.01); A61B 2562/04 (2013.01); A63B 53/04 (2013.01); A63B 2102/32 (2015.10); A63B 2220/40 (2013.01); A63B 2220/833 (2013.01); A63B 2225/02 (2013.01);
Abstract

There is provided an information processing apparatus to provide a mechanism capable of improving accuracy of detection of abnormality of sensors without changing configurations of the sensors, the information processing apparatus including: an acquisition unit configured to obtain a first value obtained by measurement in a first measurement unit and a second value obtained by measurement in a second measurement unit whose dynamic range regarding measurement is a second dynamic range different from a first dynamic range of the first measurement unit; and a detection unit configured to detect abnormality of the first value or the second value on a basis of a change in a correlation between the first value and the second value.

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