The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2021

Filed:

May. 25, 2018
Applicant:

Board of Regents, the University of Texas System, Austin, TX (US);

Inventors:

Kenneth L. Reifsnider, Colleyville, TX (US);

Md Rassel Raihan, Arlington, TX (US);

Muthu Ram Prabhu Elenchezhian, Arlington, TX (US);

Priyanshu Kumar Banerjee, Arlington, TX (US);

Chaitanya Dave, Arlington, TX (US);

Vamsee Vadlamudi, Arlington, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01N 27/02 (2006.01); G01N 27/22 (2006.01);
U.S. Cl.
CPC ...
G01N 27/026 (2013.01); G01N 27/221 (2013.01);
Abstract

In one embodiment, assessing the quality of an adhesive bond of a composite material includes passing a vector electric field through a thickness of the composite material, measuring dielectric properties of the composite material, determining one or more dielectric parameters of the composite material, and comparing the one or more dielectric parameters with one or more reference dielectric parameters.


Find Patent Forward Citations

Reifsnider, Kenneth. (2021). Systems and methods for assessing the quality of adhesive bonds (U.S. Patent No. 10989680). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10989680

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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