The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2021
Filed:
Jul. 20, 2018
Hitachi High-tech Science Corporation, Tokyo, JP;
Masahiro Sakuta, Tokyo, JP;
HITACHI HIGH-TECH SCIENCE CORPORATION, Tokyo, JP;
Abstract
Disclosed is an apparatus for and a method of mass analysis in which a presence of an accessory substance which is difficult to be analyzed can be recognized visually and clearly. The apparatus for mass analysis analyzes a sample containing a substance to be measured and includes: a display unit; a memory unit storing a theoretical peak obtained by calculation with respect to a region of a mass spectrum of the substance; a matching degree calculation unit calculating a matching degree from multiple peaks that each of the mass spectrum of the sample in the region and the theoretical peak have; a matching degree displaying control unit displaying the matching degree on the display unit; and a superimposition displaying control unit displaying the mass spectrum of the sample and the theoretical peak in a superimposed way in a manner that is consistent with a mass-to-charge ratio.