The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2021
Filed:
Oct. 21, 2016
Endress+hauser Wetzer Gmbh+co. KG, Nesselwang, DE;
Endress+Hauser Wetzer GmbH+Co. KG, Nesselwang, DE;
Abstract
A method for in-situ calibration of an analog measurement transmission path coupled with the determining and/or monitoring of a process variable of a medium is disclosed, wherein analog electrical signals are transmitted via the measurement transmission path from a control/evaluation unit to a control unit, wherein the control/evaluation unit is associated with a sensor, which determines and/or monitors the process variable based on at least one component sensitive for the process variable. The sensor is operated either in a measuring mode or in a simulation mode, wherein, in the simulation mode, the control/evaluation unit outputs for a set time span an analog electrical signal, which is unequivocally recognizable as simulated and is recognized and registered by control unit, and the calibrating of the measurement transmission path is performed, in that the control unit determines the deviation between the analog electrical signal and the registered analog electrical signal.