The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2021
Filed:
Jul. 18, 2018
Goertek Inc., Shandong, CN;
Haoran Song, Weifang, CN;
Tianrong Dai, Weifang, CN;
Yuchuan Ren, Weifang, CN;
Shunming Li, Weifang, CN;
Jinxi Cao, Weifang, CN;
GOERTEK INC., Shandong, CN;
Abstract
A binocular vision localization method, device and system are provided. The method includes calculating first pose change information according to two frames of images collected by a binocular camera unit at two consecutive moments and calculating second pose change information according to inertia parameters collected by an inertial measurement unit between the two consecutive moments. Matched feature points in the two frames are extracted from the two frames respectively. A reprojection error of each feature point is calculated. The calculations are taken as nodes or edges of a general graph optimization algorithm to acquire optimized third pose change information for localization. The system includes a binocular vision localization device, and a binocular camera unit and an inertial measurement unit respectively connected thereto, a left-eye camera and a right-eye camera are symmetrically located on two sides of the inertial measurement unit. This can improve accuracy and real-time performance for pose estimation.