The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2021
Filed:
Sep. 11, 2019
Faro Technologies, Inc., Lake Mary, FL (US);
Johannes Buback, Korntal-Munchingen, DE;
Igor Sapina, Kornwestheim, DE;
Julian Becker, Korntal-Münchingen, DE;
Martin Ossig, Tamm, DE;
Aleksej Frank, Kornwestheim, DE;
Ahmad Ramadneh, Kornwestheim, DE;
Oliver Zweigle, Stuttgart, DE;
João Santos, Kornwestheim, DE;
FARO TECHNOLOGIES, INC., Lake Mary, FL (US);
Abstract
A system and method for measuring three-dimensional (3D) coordinate values of an environment is provided. The system includes a movable base unit and a 2D scanner. A 3D scanner is coupled to the base unit, the 3D scanner measuring 3D coordinates and grey values of surfaces in the environment, the 3D scanner operating in either a compound or helical mode. Processors perform a method comprising: causing the 3D scanner to measure a first 3D coordinate values while operating in one of the compound or helical mode as the base unit is moved from the first to the second position; causing the 3D scanner to measure a second 3D coordinate values while operating in compound mode when the base unit is stationary between the first and second position; and registering the first 3D coordinate values and second 3D coordinate values into a single frame of reference.