The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2021
Filed:
Nov. 21, 2017
Continuse Biometrics Ltd., Tel Aviv, IL;
Zeev Zalevsky, Rosh HaAyin, IL;
Javier Garcia, Valencia, ES;
CONTINUSE BIOMETRICS LTD., Tel Aviv, IL;
Abstract
A system for use in inspection of a sample is described, the system comprises: an illumination unit configured to provide coherent illumination comprising a plurality of at least two wavelengths and direct said coherent illumination onto an inspection region of a sample; and a collection unit comprising at least one detector array and configured for collecting light returning from said inspection region and generate data indicative of speckle patterns in said plurality of at least two wavelengths at a predetermined sampling rate, wherein said illumination unit is configured for directing light components of said at least two wavelengths toward corresponding two or more segments of said inspection region, and wherein said data indicative of speckle patterns corresponding with said two or more segments.