The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2021

Filed:

Mar. 12, 2020
Applicant:

Formlabs, Inc., Somerville, MA (US);

Inventors:

Jack Moldave, Lincoln, MA (US);

Sarah Bennedsen, Somerville, MA (US);

Christian Reed, Chelsea, MA (US);

Konstantinos Oikonomopoulos, Boston, MA (US);

Robert Joachim, Brookline, MA (US);

Geoff Hill, Boston, MA (US);

Maxim Lobovsky, Cambridge, MA (US);

Assignee:

Formlabs, Inc., Somerville, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 64/106 (2017.01); B29C 64/393 (2017.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B29C 64/314 (2017.01); B29C 64/135 (2017.01); B01F 13/08 (2006.01); B01F 15/00 (2006.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B01F 13/0818 (2013.01); B01F 15/00201 (2013.01); B29C 64/135 (2017.08); B29C 64/314 (2017.08); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B01F 2215/0049 (2013.01);
Abstract

According to some aspects, a mixer for detection and/or removal of material in an undesired location of an additive fabrication device is provided. For instance, in an inverse stereolithography device, liquid photopolymer may adhere and cure or partially cure to a surface of the additive fabrication device in a location that may interfere with the additive fabrication process and/or cause the additive fabrication process to be unsuccessful. The mixer may be coupled to a movable structure within the additive fabrication device so that the mixer, when coupled to the movable structure, may be moved along at least one axis within the additive fabrication device. The mixer may be configured to detect and/or remove undesired material from a surface within the additive fabrication device.


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