The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
Sep. 24, 2019
Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;
Abstract
An abnormality in a manufacturing system is detected without extensive modification to the existing manufacturing systems. The data analysis device includes: a receiver configured to receive a packet transmitted between a manufacture control device and a manufacturing device; an analyzer configured to obtain the type of data included in a payload of the received packet from an IP address and a port number included in a header of the packet; a selector configured to select, based on the type of the data obtained by the analyzer, a syntax or rule corresponding to the type of the data; and a determiner configured to determine that the manufacturing system has an abnormality if the data included in the payload does not follow the syntax or rule corresponding to the type of the data.