The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2021

Filed:

Dec. 19, 2017
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Wei-Guo Peng, Dallau, DE;

Lin Luo, Wiesloch, DE;

Hartwig Seifert, Elchesheim-Illingen, DE;

Nan Zhang, Schriesheim, DE;

Harish Mehta, Wiesenbach, DE;

Florian Chrosziel, St. Leon-Rot, DE;

Rita Merkel, Ilvesheim, DE;

Eugen Pritzkau, Wiesloch, DE;

Jona Hassforther, Heidelberg, DE;

Thorsten Menke, Bad Iburg, DE;

Thomas Kunz, Lobbach/Lobenfeld, DE;

Kathrin Nos, Nussloch, DE;

Marco Rodeck, Maikammer, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/0485 (2013.01); H04L 29/06 (2006.01); G06F 3/0482 (2013.01); G06F 21/55 (2013.01); G06F 3/0484 (2013.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); G06F 3/0482 (2013.01); G06F 3/04842 (2013.01); G06F 21/552 (2013.01); H04L 63/0227 (2013.01); G06F 3/0485 (2013.01); G06F 2203/04806 (2013.01);
Abstract

One or more entities are selected for which logged Events are to be displayed in an Event Series Chart. One or more filters and a timeframe are selected. Events are fetched from one or more selected log files based on the one or more selected filters and the timeframe. The fetched Events are displayed in an Event Series Chart according to an associated timestamp and identification Event property value associated with each fetched Event.


Find Patent Forward Citations

Loading…