The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2021

Filed:

Aug. 28, 2018
Applicant:

Analog Devices International Unlimited Company, Hamilton, BM;

Inventors:

Bijesh Poyil, Bangalore, IN;

Hans Brueggemann, Kelkheim, DE;

Daniel Brian O'Malley, Cappamore, IE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02S 50/10 (2014.01); G01R 31/12 (2020.01);
U.S. Cl.
CPC ...
H02S 50/10 (2014.12); G01R 31/1227 (2013.01);
Abstract

An arc detection method includes classifying whether an arc fault is present in the power system by, for each of a plurality of bins of a current frame of a signal, marking the bin as a candidate bin if a magnitude spectrum of the bin meets first criteria; determining a number of candidate bins in the current frame; marking the number of candidate bins as candidate cluster bins if the number of candidate bins exceeds a minimum cluster size; for each of the candidate cluster bins, determining whether the candidate cluster bin is also a candidate cluster bin of a previous frame of the first signal and if so, identifying the current frame as a candidate frame and incrementing a candidate frame count; and if the candidate frame count exceeds a candidate frame count threshold, determining that an arc fault is present in the power system.


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