The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
Dec. 06, 2017
Koninklijke Philips N.v., Eindhoven, NL;
Frank Bergner, Uelzen, DE;
Bernhard Johannes Brendel, Hamburg, DE;
Thomas Koehler, Hamburg, DE;
Kevin Martin Brown, Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
An imaging system () includes a radiation source () configured to emit X-ray radiation, a detector array () configured to detected X-ray radiation and generate projection data indicative thereof, and a first processing chain () configured to reconstruct the projection data and generate a noise only image. A method includes receiving projection data produced by an imaging system and processing the projection data with a first processing chain configured to reconstruct the projection data and generate a noise only image. A processor is configured to: scan an object or subject with an x-ray imaging system and generating projection data, process the projection data with a first processing chain configured to reconstruct the projection data and generate a noise only image, process the projection data with a second processing chain configured to reconstruct the projection data and generate a structure image, and de-noise the structure image based on the noise only image.