The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
May. 28, 2019
Applicant:
Fanuc Corporation, Yamanashi, JP;
Inventor:
Kenji Takahashi, Yamanashi, JP;
Assignee:
FANUC CORPORATION, Yamanashi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); D06H 3/08 (2006.01); G06K 9/46 (2006.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0006 (2013.01); D06H 3/08 (2013.01); G01N 21/95607 (2013.01); G06K 9/4604 (2013.01); D06H 2201/10 (2013.01); G06T 2207/30124 (2013.01);
Abstract
A seam inspection apparatus can automatically determine the quality of an image of a seam of a sewn product. The seam inspection apparatus includes an image data acquisition unit that acquires image data of a seam of a sewn product, a feature extraction unit that extracts a feature quantity of the seam from the image data of the seam of the sewn product acquired by the image data acquisition unit, and a quality determination unit that performs quality determination of the seam based on the feature quantity of the seam.