The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
May. 10, 2018
Sas Institute Inc., Cary, NC (US);
Michael James Leonard, Cary, NC (US);
Jie Zhong, Cary, NC (US);
Kyungduck Cha, Cary, NC (US);
Rajendra Singh Solanki, Cary, NC (US);
Rajib Nath, Pune, IN;
Macklin Frazier, Cary, NC (US);
Li Xu, Cary, NC (US);
SAS INSTITUTE INC., Cary, NC (US);
Abstract
Time-series projections can be analyzed and manipulated via an interactive graphical user interface generated by a system. The graphical user interface can include a graph depicting an aggregated time-series projection (ATSP) over a future time. The ATSP can be generated by aggregating multiple time-series. The system can receive user input indicating that an existing value in the ATSP is to be overridden with an override value. In response, the system can adjust the ATSP using the override value to generate an updated version of the ATSP. The system can display the updated version of the ATSP in the graphical user interface. The system can also propagate the impact of overriding the existing value with the override value through the multiple time-series. The system can display an impact analysis portion within the graphical user interface indicating the impact of overriding the existing value with the override value on the multiple time-series.