The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
Jun. 27, 2019
Applicant:
Proto Labs, Inc., Maple Plain, MN (US);
Inventors:
James L Jacobs, Amherst, NH (US);
Arthur Richard Baker, III, Excelsior, MN (US);
Assignee:
Proto Labs, Inc., Maple Plain, MN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G05B 19/4099 (2006.01); B33Y 50/00 (2015.01); B33Y 40/20 (2020.01); B33Y 10/00 (2015.01);
U.S. Cl.
CPC ...
G05B 19/4099 (2013.01); B33Y 40/20 (2020.01); B33Y 50/00 (2014.12); B33Y 10/00 (2014.12); G05B 2219/35134 (2013.01); G05B 2219/49008 (2013.01);
Abstract
An automated manufacturing system for manufacturing a discrete object is configured to manufacture a reference feature on a precursor to the discrete object. Reference feature is used to place the precursor at a subtractive manufacturing machine; the reference feature may be based on a locating feature at the subtractive manufacturing machine. Manufacturing reference feature is accomplished by automatedly detecting one or more critical-to-quality features and manufacturing the reference feature based on the one or more detected critical-to-quality features.