The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2021

Filed:

Jul. 16, 2019
Applicant:

Abbott Laboratories, Abbott Park, IL (US);

Inventors:

Trevor David Shields, Berwick, AU;

Robert John Fahey, Elwood, AU;

Damian J. Verdnik, McKinnon, AU;

Svitlana Y. Berezhna, Los Gatos, CA (US);

Mahmoud Janbakhsh, San Ramon, CA (US);

Koshy T. Chacko, San Jose, CA (US);

Assignee:

Abbott Laboratories, Abbott park, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 7/38 (2021.01); G02B 21/08 (2006.01); G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
G02B 7/38 (2013.01); G02B 21/088 (2013.01); G02B 21/244 (2013.01); G02B 21/245 (2013.01);
Abstract

Methods, systems and devices for automatically focusing a microscope on a specimen and collecting a focused image of the specimen are provided. Aspects of the methods include detecting the presence of a substrate in a microscope, determining whether the substrate is in a correct orientation for imaging, focusing the microscope on a specimen that is placed on the substrate, and collecting one or more images of the specimen. Systems and devices for carrying out the subject methods are also provided.


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