The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2021

Filed:

Oct. 12, 2018
Applicant:

The Regents of the University of Michigan, Ann Arbor, MI (US);

Inventors:

Nicholas A. Kotov, Ypsilanti, MI (US);

Sharon Glotzer, Chelsea, MI (US);

Brian Shahbazian, Petaluma, CA (US);

Ryan Branch, Indianapolis, IN (US);

Lizhi Xu, Ann Arbor, MI (US);

Wonjin Choi, Ann Arbor, MI (US);

Minjeong Cha, Ann Arbor, MI (US);

Matthew Spellings, Mercer, TN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 17/89 (2020.01); G01S 7/481 (2006.01); G02B 5/30 (2006.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01S 7/481 (2013.01); G02B 5/3025 (2013.01); G01S 17/931 (2020.01);
Abstract

Material-Sensing Light Imaging, Detection, And Ranging (LIDAR) systems optionally include a laser configured to generate a light pulse, a beam steerer configured to produce a polarization-adjusted light pulse emitted towards an object, at least one polarizer configured to polarize reflected, scattered, or emitted light returned from the object, and a processor configured to detect at least one material of the object based on an intensity and polarization of the polarized reflected, scattered or emitted light from the object. The beam steerer may include a kirigami nanocomposite. Methods are also provided, including, for example, generating a light pulse, adjusting a polarization of the light pulse to produce a polarization-adjusted light pulse emitted towards an object, polarizing reflected, scattered, or emitted light returned from the object, and detecting at least one material of the object based on an intensity and polarization of the polarized reflected, scattered or emitted light from the object.


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