The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
Dec. 20, 2018
International Business Machines Corporation, Armonk, NY (US);
Stefan Payer, Stuttgart, DE;
Michael Klein, Schoenaich, DE;
Cedric Lichtenau, Stuttgart, DE;
Ralf Richter, Lichtenstein, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system, apparatus, and method of testing a plurality of test circuits is disclosed that includes inputting experiment data to the plurality of test circuits; applying a control signal to each of the plurality of test circuits to control application of the experiment data to the plurality of test circuits; and shifting the control signal in response to applying the control signal to each of the plurality of test circuits so that a different bit of the control signal is applied to each of the plurality of test circuits. The method in an aspect further comprises reading out a data out signal from each of the plurality of test circuits; and shifting the data out signal in response to reading out the data out signal from each of the plurality of test circuits.