The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
Apr. 29, 2019
University of South Carolina, Columbia, SC (US);
Victor Giurgiutiu, Columbia, SC (US);
Mohammad Faisal Haider, West Columbia, SC (US);
Banibrata Poddar, Rockville, MD (US);
University of South Carolina, Columbia, SC (US);
Intelligent Automation, Inc., Rockville, MD (US);
Abstract
Computationally efficient, highly accurate, and cost-effective approach for detection of damage in a structure is described. Methods include a combined analysis in both global and local regions of a structure to predict the received wave signals at a location due to scattering of Lamb waves at a damage site. Through comparison of an actual received wave signal with the predicted signals, identification of damage location and/or type can be provided. Methods can be particularly beneficial when considering damage assessment in a complex structure that includes plate-like structures that include an extension off of a base plate, e.g., a stiffened structure.