The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
Feb. 15, 2018
Applicant:
Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;
Inventors:
Karim Vindas, Grenoble, FR;
Elodie Engel, Grenoble, FR;
Loic Leroy, Grenoble, FR;
Thierry Livache, Jarry, FR;
Arnaud Buhot, Saint Etienne de Crossey, FR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01); G01N 21/552 (2014.01); G01N 21/77 (2006.01); G01N 21/43 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01N 21/431 (2013.01); G01N 21/554 (2013.01); G01N 21/7703 (2013.01); G01N 21/7746 (2013.01); G01N 2021/432 (2013.01); G01N 2021/434 (2013.01); G01N 2021/458 (2013.01); G01N 2021/772 (2013.01);
Abstract
The invention relates to a method for detecting a local change in refractive index of a dielectric medium located on the surface of an optical sensor, said optical sensor comprising for this purpose a waveguide comprising a region, called the active region, covered with at least one metallic layer in contact with the dielectric medium, said method comprising the following steps: