The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
Dec. 22, 2016
Hitachi High-tech Corporation, Tokyo, JP;
Akira Masuya, Tokyo, JP;
Muneo Maeshima, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
In the present invention, information is analyzed, the positional relationship of cells/microbes in the optical axis direction is detected, and motility of cells/microbes is evaluated even in an out-of-focus view from an image obtained by a single image capture in an observation view of the cells/microbes. The present invention is provided with an optical system used to measure microparticles present in a sample liquid in a sample container, a drive mechanism for driving the sample container and/or a portion of the optical system in order to three-dimensionally search a bottom surface of the sample container, a control unit for controlling the optical system or the drive mechanism, an image processing unit for dividing an image of microparticles in the sample container at a first time and a second time into an in-focus region and an out-of-focus region and acquiring information relating to the microparticles, and a display unit for displaying the information relating to the microparticles as information representing a temporal change between the first time and the second time.