The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
Jul. 12, 2018
Applicant:
Olympus America Inc., Center Valley, PA (US);
Inventors:
Jinchi Zhang, Quebec, CA;
Nicolas Badeau, Quebec, CA;
Assignee:
Olympus America Inc., Center Valley, PA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 17/06 (2006.01); G01S 7/52 (2006.01); G01S 15/08 (2006.01); G01N 29/46 (2006.01); G01B 17/02 (2006.01);
U.S. Cl.
CPC ...
G01B 17/06 (2013.01); G01B 17/02 (2013.01); G01N 29/46 (2013.01); G01S 7/52006 (2013.01); G01S 15/08 (2013.01);
Abstract
Disclosed is a system and method for ultrasonic measurement of the average diameter and surface profile of a tube. A calibration block is used to calibrate the average tube diameter, and a correction is applied to account for any temperature difference of the couplant between calibration and test measurements. By using a linear probe, or a single probe with a finely pitched helicoidal scan, errors in diameter measurement due to presence of surface pits may be compensated.