The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
Jun. 12, 2018
Applicant:
Sightline Innovation Inc., Toronto, CA;
Inventors:
Wallace Trenholm, Toronto, CA;
Lorenzo Pons, Toronto, CA;
Assignee:
Sightline Innovation Inc., Toronto, CA;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01B 11/24 (2006.01); G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02028 (2013.01); G01B 9/02035 (2013.01); G01B 9/02091 (2013.01); G01B 11/14 (2013.01); G01B 11/2441 (2013.01);
Abstract
A system and method for surface inspection of an object using multiplexed optical coherence tomography (OCT) is provided. The method includes moving the object relative to two or more scanner heads along a direction of travel; alternatingly directing a sample beam to each of the two or more scanner heads; and when the sample beam is directed at each respective scanner head, scanning comprising: steering the sample beam from the respective scanner head to an unscanned region on the surface of the object; and performing an A-scan of the object.