The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
Jun. 27, 2019
Takuji Kamada, Kanagawa, JP;
Takuji Kamada, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An inspection apparatus that inspects printed matter generated based on print data by using a read image of a printed surface of the printed matter includes processing circuitry. The processing circuitry performs acquisition, calculation, correction, and comparison. The processing circuitry acquires the read image as an inspection target image, and acquires a reference image based on the print data. The processing circuitry calculates a flare inverse correction value based on flare that occurs at time of creation of the inspection target image. The processing circuitry performs flare inverse correction on the reference image based on the flare inverse correction value to acquire a corrected reference image. The processing circuitry compares the corrected reference image with the inspection target image to perform inspection.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile