The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2021

Filed:

Jun. 29, 2017
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Ewald Roessl, Ellerau, NL;

Roger Steadman, Aachen, DE;

Christoph Herrmann, Aachen, DE;

Roland Proksa, Neu Wulmstorf, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/046 (2018.01); G01N 23/083 (2018.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/585 (2013.01); A61B 6/4241 (2013.01); A61B 6/482 (2013.01); A61B 6/5258 (2013.01); G01N 23/046 (2013.01); G01N 23/083 (2013.01); G06T 11/003 (2013.01); G01N 2223/303 (2013.01); G01N 2223/401 (2013.01); G01N 2223/505 (2013.01);
Abstract

An image signal processing system (ISP) comprising an input interface (IN) for receiving photon counting projection data acquired by an X-ray imaging apparatus (IA) having a photon counting detector (D). A calibration data memory (CMEM) of the system holds calibration data. The calibration data encodes photon counting data versus path lengths curves for different energy thresholds of i) said detector (D) or ii) of a different detector. At least one of said curves is not one-to-one. A path length convertor (PLC) of the system converts an entry in said photon counting projection data into an associated path length based on said calibration data.


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