The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Jul. 31, 2018
Canon Kabushiki Kaisha, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
To perform a high-accuracy three-dimensional measurement by performing an appropriate calibration in accordance with various temperature changes, an information processing apparatus that decides a temperature-dependent parameter of a projection apparatus configured to project a pattern onto a measurement target object to perform a three-dimensional measurement includes a holding unit configured to hold a relationship in which the temperature-dependent parameter of the projection apparatus is set as a temperature function, a temperature input unit configured to input a temperature of the projection apparatus, and a temperature-dependent parameter decision unit configured to decide the temperature-dependent parameter of the projection apparatus based on the temperature of the projection apparatus which is input by the temperature input unit and the relationship.