The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2021

Filed:

Aug. 07, 2019
Applicants:

Yiqun GE, Ottawa, CA;

Wuxian Shi, Ottawa, CA;

Wen Tong, Ottawa, CA;

Inventors:

Yiqun Ge, Ottawa, CA;

Wuxian Shi, Ottawa, CA;

Wen Tong, Ottawa, CA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2006.01); G06N 3/08 (2006.01); G06F 17/18 (2006.01); G06N 20/20 (2019.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
H04L 5/0069 (2013.01); G06F 17/18 (2013.01); G06N 3/0454 (2013.01); G06N 3/08 (2013.01); G06N 20/20 (2019.01);
Abstract

Methods and apparatuses for measuring a distance between two signal distributions in a common signal space are described. A measurement network is configured to receive first and second signal distributions as input and output a measurement of a Wasserstein distance between the first and second signal distributions. The measurement network may be implemented using a neural network.


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