The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2021

Filed:

Dec. 27, 2018
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Tien-Yan Ma, New Taipei, TW;

Te-Mei Wang, Hsinchu, TW;

Ping-Chang Shih, Yuanlin, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/55 (2017.01); G06T 7/12 (2017.01); G06T 7/174 (2017.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/12 (2017.01); G06T 7/174 (2017.01); G06T 7/55 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/20132 (2013.01);
Abstract

A depth camera calibration device and a method thereof are provided. The method comprises: disabling a projection function of a camera and photographing surface planes to obtain a first image; enabling the projection function of the camera and photographing the surface planes to obtain a second image, and a positional relationship between the camera and a calibration plate assembly remaining unchanged when obtaining the first image and the second image; and obtaining parameters of the camera by cropping an image boundary, calculating positions of characteristic points, reading a projection pattern, calculating positions of corresponding points and excluding abnormal points according to the first image and the second image.


Find Patent Forward Citations

Loading…