The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Dec. 20, 2018
Wistron Neweb Corporation, Hsinchu, TW;
Yi-An Chen, Hsinchu, TW;
Po-Ching Wu, Hsinchu, TW;
WISTRON NEWEB CORPORATION, Hsinchu, TW;
Abstract
Disclosed are an image calibration method and an image calibration apparatus. The image calibration method is adapted to the image calibration apparatus. The image calibration method includes: step (A): capturing an input image having a calibration pattern, wherein the calibration pattern includes at least one frame and an analysis block, the analysis block is surrounded by the frame, and the analysis block includes a plurality of characteristic patterns separated from each other; step (B): determining whether at least one frame is within the input image; step (C): capturing the analysis block when the at least one frame is within the input image; and step (D): executing one of a displacement calibration, a scaling ratio, a rotation calibration, a keystone calibration or a combination thereof for the input image according to positions of the characteristic patterns within the analysis block to generate an output image.