The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Jan. 30, 2018
Sumitomo Mitsui Construction Co, Ltd., Tokyo, JP;
Kyushu University, National University Corporation, Fukuoka, JP;
Kentaro Tokura, Tokyo, JP;
Naoki Nagamoto, Tokyo, JP;
Takao Kakehashi, Tokyo, JP;
Motohiro Ikehara, Tokyo, JP;
Hideaki Uchiyama, Fukuoka, JP;
SUMITOMO MITSUI CONSTRUCTION CO., LTD., Tokyo, JP;
KYUSHU UNIVERSITY, NATIONAL UNIVERSITY CORPORATION, Fukuoka, JP;
Abstract
[Problem] To enable three-dimensional measurement with good precision. [Solution] When three-dimensional measurement is to be performed with good precision using SLAM or the like, images of marks M, M, M, Mmust be captured from various directions by a single-lens camera. In the present invention, directions of imaging by a camera are displayed as sectors C, C, C, C. For example, it is understood that whereas sectors Cand Chave a large central angle and imaging therein is performed from a wide range of directions, sectors Cand Chave a small central angle and imaging therein is performed from a narrow range of directions. A photographer seeing such a display can perform additional imaging, and images can therefore be obtained from a wide range of directions, and three-dimensional measurement can be performed with good precision.