The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Jan. 04, 2019
Sightline Innovation Inc., Toronto, CA;
Wallace Trenholm, Toronto, CA;
Maithili Mavinkurve, Markham, CA;
Mark Alexiuk, Winnipeg, CA;
Jason Cassidy, Hamilton, CA;
Sightline Innovation Inc., Toronto, CA;
Abstract
Embodiments described herein relate to systems and methods for specular surface inspection, and particularly to systems and methods for surface inspection comprising inverse synthetic aperture imaging ('ISAI') and specular surface geometry imaging ('SSGI'). Embodiments may allow an object under inspection, to be observed, imaged and processed while continuing to be in motion. Further, multiple optical input sources may be provided, such that the object does not have to be in full view of all optical sensors at once. Further, multi-stage surface inspection may be provided, wherein an object under inspection may be inspected at multiple stages of an inspection system, such as, for an automotive painting process, inspection at primer, inspection at paint, inspection at final assembly. SSGI imaging modules are also described for carrying out micro-deflectometry.