The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
May. 13, 2020
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventor:
Takahide Nogayama, Tokyo, JP;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01);
Abstract
Methods and systems for estimating latent service and latent wait times include extracting transition times between activities from a partial event log. Parameters for respective gamma distributions are estimated that characterize latent waiting time and latent service time for each activity. A latent waiting time and latent service time for each activity is estimated based on the estimated parameters using a processor.
Nogayama, Takahide. (2021). Estimation of latent waiting and service times from incomplete event logs (U.S. Patent No. 10977577). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10977577
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile