The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Oct. 17, 2018
Fujifilm Corporation, Tokyo, JP;
Hiroaki Kikuchi, Tokyo, JP;
Masashi Kuranoshita, Yokohama, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An object of the present invention is to provide an index generating method and index generating apparatus capable of accurately and stably generating an index for measuring a width of a subject, and a measuring method capable of accurately and stably measuring a width of a subject. An index generating method according to one embodiment of the present invention includes: an image input step of inputting an image obtained by imaging a linear subject; a density distribution acquiring step of acquiring, from the input image, a plurality of density distributions along a direction orthogonal to a width direction of the linear subject, which are density distributions in the width direction of the linear subject; a function calculating step of calculating a probability distribution function corresponding to the acquired plurality of density distributions; and an index generating step of generating an index indicating a width of the subject based on the calculated probability distribution function.