The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2021

Filed:

May. 15, 2015
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Michael Rudolf, Heidelberg, DE;

Hannes Voigt, Dresden, DE;

Christof Bornhövd, Belmont, DE;

Wolfgang Lehner, Dresden, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 16/254 (2019.01);
Abstract

Disclosed herein are system, method, and computer program product embodiments for performing ad-hoc analytical queries of graph data. An embodiment operates by receiving a graph pattern for a subgraph of interest. The facts of interest are then selected from graph data based on the received graph pattern. Dimensions are then defined based on a dimension seed pattern and a set of level expressions, and measures are defined based on a computation function and an aggregation function. A graph cube is formed based on the selected facts and the defined dimensions and measures. Because the facts, dimensions, and measures of interest are defined at the time of an analytical query, a user does not have to define such facts, dimensions, and measures, or know which analytical queries will be of interest, at the time of data collection.


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