The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Jan. 25, 2019
At&t Intellectual Property I, L.p., Atlanta, GA (US);
Vladislav Shkapenyuk, New York, NY (US);
Tamraparni Dasu, New Vernon, NJ (US);
Divesh Srivastava, Summit, NJ (US);
Deborah Swayne, Jersey City, NJ (US);
AT&T Intellectual Property I, L.P., Atlanta, GA (US);
Abstract
A system for providing continuous monitoring of data quality in a dynamic feed environment is disclosed. In particular, the system utilizes a feed inspection tool to detect anomalies in data gathering detected from feed metadata and anomalies in data measurement detected based on file contents. In order to do so, the feed inspection tool may aggregate, for a plurality of aggregation intervals, data feeds and associated metadata feeds. Once the data feeds and metadata feeds are aggregated, the feed inspection tool may generate, for a baseline model feed, baseline statistical models by utilizing historical data of the aggregated feeds in sliding windows of different lengths. The feed inspection tool may then identify, for a plurality of monitoring time delays, data outliers by comparing the aggregated feeds with the baseline model feed. A data quality feed based on the data outliers identified may then be generated and published.