The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Nov. 12, 2018
Applicant:
Sz Dji Technology Co., Ltd., Shenzhen, CN;
Inventors:
Cong Zhao, Shenzhen, CN;
Minjian Pang, Shenzhen, CN;
Rui Li, Shenzhen, CN;
You Zhou, Shenzhen, CN;
Zhe Liu, Shenzhen, CN;
Guyue Zhou, Shenzhen, CN;
Assignee:
SZ DJI TECHNOLOGY CO., LTD., Shenzhen, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/00 (2011.01); G06T 7/00 (2017.01); G05D 1/10 (2006.01); G01S 3/786 (2006.01); G06K 9/00 (2006.01); G06T 7/246 (2017.01); H04N 5/232 (2006.01); G06T 7/70 (2017.01); B64C 39/02 (2006.01); G05D 1/00 (2006.01); G05D 1/12 (2006.01); G06T 7/20 (2017.01);
U.S. Cl.
CPC ...
G05D 1/106 (2019.05); B64C 39/024 (2013.01); G01S 3/7864 (2013.01); G05D 1/0011 (2013.01); G05D 1/0094 (2013.01); G05D 1/12 (2013.01); G06K 9/0063 (2013.01); G06K 9/00664 (2013.01); G06T 7/20 (2013.01); G06T 7/246 (2017.01); G06T 7/248 (2017.01); G06T 7/70 (2017.01); H04N 5/2328 (2013.01); H04N 5/23299 (2018.08); B64C 2201/127 (2013.01); B64C 2201/141 (2013.01); B64C 2201/145 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10032 (2013.01); G06T 2210/12 (2013.01); H04N 5/232 (2013.01);
Abstract
A method for supporting target tracking includes obtaining a feature model for a target that represents imagery characteristics of the target, extracting one or more features from one or more images captured by an imaging device carried by a movable object, and applying the feature model on the one or more features to determine similarity between the one or more features and the feature model.