The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Jan. 13, 2017
Hitachi, Ltd., Tokyo, JP;
Kouji Kageyama, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Provided is an abnormality diagnosis system with which it is possible to express the propagation relationship of effects among areas, and to easily determine the area that is the factor causing a state that differs from normal operation, even when there is an extremely large number of devices in a facility. The present invention has a state change detection means that has a plurality of detection units set for each area of a facility and that detects state changes from changes in the relationship of a plurality of operation data items pertaining to the areas monitored by the detection units. The area that is the cause of a state change at the facility is estimated on the basis of the state change detection results of the detection units of the state change detection means, and on the basis of information about the relationships between the detection units, the information containing the propagation relationship of effects among the areas of the facility that correspond to the detection units.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile