The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2021

Filed:

Oct. 02, 2017
Applicant:

Hoya Corporation, Tokyo, JP;

Inventors:

Yutaka Takakubo, Saitama, JP;

Eijiroh Tada, Saitama, JP;

Assignee:

HOYA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 13/00 (2006.01); G02B 15/14 (2006.01); G02B 13/18 (2006.01);
U.S. Cl.
CPC ...
G02B 13/0045 (2013.01); G02B 13/18 (2013.01); G02B 15/142 (2019.08);
Abstract

An imaging optical system includes a positive or negative first lens group, a diaphragm and a positive second lens group. The first lens group includes a positive lens element, provided closest to the object side, that has an aspherical surface on the object side thereof, the aspherical surface including a paraxial convex surface convexing toward the object side. This aspherical surface has a curvature that is positive along a meridional cross-section at the paraxial portion thereof, and the curvature of the meridional cross-section changes from a positive value to a negative value in an area within 75% of an effective aperture from the paraxial portion toward the periphery of the aspherical surface.


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