The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2021

Filed:

Nov. 23, 2017
Applicant:

Fogale Nanotech, Nîmes, FR;

Inventors:

Christian Neel, Nîmes, FR;

Frédéric Ossart, Langlade, FR;

Didier Roziere, Nîmes, FR;

Assignee:

FOGALE NANOTECH, Nîmes, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/08 (2006.01); H03K 17/955 (2006.01); H03K 17/975 (2006.01); H03K 17/96 (2006.01);
U.S. Cl.
CPC ...
G01V 3/088 (2013.01); H03K 17/955 (2013.01); H03K 17/962 (2013.01); H03K 17/975 (2013.01); H03K 2017/9606 (2013.01); H03K 2217/960765 (2013.01);
Abstract

A device for detecting an object with respect to a detection surface including at least one measurement electrode and at least one guard electrode separated by a distance (D) that is elastically modifiable locally by a load exerted by the object on the detection surface; and structure for electrical polarization of the electrodes (V, E) arranged in order to: (i) apply to the measurement and guard electrodes one and the same first alternating electrical potential (V) so as to measure a first signal relating to an electrode-object capacitance (C); and (ii) apply between the measurement and guard electrodes an alternating electrical potential difference (V), so as to measure a second electrical signal relating to an electrode-guard capacitance (C). A detection method utilizing the present detection device is also provided.


Find Patent Forward Citations

Neel, Christian. (2021). Device and method for detecting the approach and/or contact, and the pressure of an object in relation to a detection surface (U.S. Patent No. 10976460). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10976460

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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