The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2021

Filed:

Jun. 17, 2019
Applicant:

Saudi Arabian Oil Company, Dhahran, SA;

Inventors:

Daniele Colombo, Dhahran, SA;

Federico Miorelli, Al Khobar, SA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/00 (2006.01); G01V 1/28 (2006.01); G01V 1/36 (2006.01);
U.S. Cl.
CPC ...
G01V 1/364 (2013.01); G01V 1/362 (2013.01); G01V 2210/24 (2013.01); G01V 2210/322 (2013.01); G01V 2210/53 (2013.01);
Abstract

A surface-consistent refraction analysis automatically derives near surface corrections during seismic data processing. Residual time lags are evaluated in multiple CMP-offset-azimuth bins by similarity analysis with a pilot trace where a correlation window is centered at the refracted arrival. The similarity analysis may take the form of computerized cross-correlation, or other criteria such as semblance. The residuals are then used to build a system of linear equations that is simultaneously inverted for surface-consistent shot and receiver time shift corrections plus a possible subsurface residual term. The refraction analysis steps are completely automated and require a fraction of the time needed for conventional near surface analysis.


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