The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Dec. 06, 2019
University of Maryland, College Park, College Park, MD (US);
Government of the United States As Represented BY the Director, National Security Agency, Washington, DC (US);
Ting Xie, Burtonsville, MD (US);
Michael Dreyer, College Park, MD (US);
Isaak D. Mayergoyz, Rockville, MD (US);
Robert E. Butera, Prince Frederick, MD (US);
Charles S. Krafft, Owings, MD (US);
University of Maryland, College Park, College Park, MD (US);
Government of the United States of America as Represented by the Director, National Security Agency, Fort Meade, MD (US);
Abstract
A scanning tunneling microscopy based potentiometry system and method for the measurements of the local surface electric potential is presented. A voltage compensation circuit based on this potentiometry system and method is developed and employed to maintain a desired tunneling voltage independent of the bias current flow through the film. The application of this potentiometry system and method to the local sensing of the spin Hall effect is outlined herein, along with the experimental results obtained.