The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Oct. 30, 2019
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/10 (2006.01); G02B 3/06 (2006.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0208 (2013.01); G01J 3/0218 (2013.01); G01J 3/0229 (2013.01); G01J 3/10 (2013.01); G02B 3/06 (2013.01); G01J 2003/102 (2013.01); G01J 2003/1213 (2013.01);
Abstract
Provided is an optical apparatus using reflection geometry. The optical apparatus includes a lens element disposed to face an object to be measured, a light source generating an incident beam that passes through the lens element to be incident on the object, and a photodetector receiving light that is scattered by the object. The incident beam is obliquely incident on the object off an optical center axis of the lens element, without passing through the optical center axis. The scattered light is transmitted to the photodetector by passing through the optical center axis of the focusing lens element and a region therearound.