The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2021

Filed:

Nov. 05, 2018
Applicant:

Slm Solutions Group Ag, Luebeck, DE;

Inventors:

Lukas Roesgen, Luebeck, DE;

Jan Wilkes, Luebeck, DE;

Assignee:

SLM SOLUTIONS GROUP AG, Luebeck, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/401 (2006.01); B29C 64/268 (2017.01); B29C 64/386 (2017.01); B28B 17/00 (2006.01); B29C 64/393 (2017.01); B22F 3/105 (2006.01); B33Y 30/00 (2015.01); B33Y 40/00 (2020.01); B33Y 10/00 (2015.01); B33Y 50/02 (2015.01); B29C 64/153 (2017.01); B28B 1/00 (2006.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B22F 3/1055 (2013.01); B28B 1/001 (2013.01); B28B 17/0081 (2013.01); B29C 64/153 (2017.08); B29C 64/268 (2017.08); B29C 64/386 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 40/00 (2014.12); B33Y 50/02 (2014.12); G05B 19/401 (2013.01); B22F 2003/1057 (2013.01); G05B 2219/37067 (2013.01); G05B 2219/37068 (2013.01); G05B 2219/37555 (2013.01); G05B 2219/37572 (2013.01); G05B 2219/49007 (2013.01); Y02P 10/25 (2015.11);
Abstract

A device for calibrating an irradiation system of an apparatus for producing a three-dimensional work piece includes a control unit to control the irradiation system so as to irradiate a radiation beam onto an irradiation plane according to a calibration pattern. The device also includes a sensor arrangement arranged in the irradiation plane to output signals to the control unit in response to being irradiated with the radiation beam according to the calibration pattern. The control unit generates a digital image of an actual irradiation pattern produced by the radiation beam incident on the sensor arrangement based on the signals output by the sensor arrangement, compares the digital image of the actual irradiation pattern with a digital image of a reference pattern so as to determine a deviation between the actual irradiation pattern and the reference pattern, and calibrates the irradiation system based on the determined deviation between the actual irradiation pattern and the reference pattern.


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