The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2021

Filed:

Oct. 28, 2015
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Tao Hu, Beijing, CN;

Li Ming Huang, Beijing, CN;

Yue Zhuo, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); G05B 19/048 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1623 (2013.01); B25J 9/1674 (2013.01); G05B 19/048 (2013.01); G05B 23/0245 (2013.01); G05B 2219/40235 (2013.01); G05B 2219/49278 (2013.01);
Abstract

A method and apparatus are for abnormality detection. The method includes: acquiring an estimated value of a movement parameter of a mobile platform of a parallel robot. The estimated value is calculated based on sensing information about a sensor mounted on the mobile platform. Based on the estimated value and a designated value of the movement parameter, the method includes determining whether an abnormality occurs in the parallel robot. By way of the method and apparatus, abnormality of a parallel robot can be detected reliably.


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