The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Jun. 16, 2017
7d Surgical Inc., Toronto, CA;
Adrian Mariampillai, Toronto, CA;
Kenneth Kuei-Ching Lee, Toronto, CA;
Michael Leung, Markham, CA;
Peter Siegler, Toronto, CA;
Beau Anthony Standish, Toronto, CA;
Victor X. D. Yang, North York, CA;
7D SURGICAL INC., Toronto, CA;
Abstract
Disclosed are systems and methods for obtaining a structured light reconstruction using a hybrid spatio-temporal pattern sequence projected on a surface. The method includes projecting a structured light pattern, such as a binary de Bruijn sequence, onto a 3D surface and acquiring an image set of at least a portion of this projected sequence with a camera system, and projecting a binary edge detection pattern onto the portion of the surface and acquiring an image set of the same portion of the projected binary pattern. The acquired image set of the binary pattern is processed to determine edge locations therein, and then employed to identify the locations of pattern edges within the acquired image set of the structured light pattern. The detected edges of the structured light pattern images are employed to decode the structured light pattern and calculate a disparity map, which is used to reconstruct the 3D surface.